The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2023
Filed:
Jan. 28, 2021
X Development Llc, Mountain View, CA (US);
Cheng-en Guo, Santa Clara, CA (US);
Wilson Zhao, Fremont, CA (US);
Jie Yang, Sunnyvale, CA (US);
Zhiqiang Yuan, San Jose, CA (US);
Elliott Grant, Woodside, CA (US);
X DEVELOPMENT LLC, Mountain View, CA (US);
Abstract
Implementations relate to diagnosis of crop yield predictions and/or crop yields at the field- and pixel-level. In various implementations, a first temporal sequence of high-elevation digital images may be obtained that captures a geographic area over a given time interval through a crop cycle of a first type of crop. Ground truth operational data generated through the given time interval and that influences a final crop yield of the first geographic area after the crop cycle may also be obtained. Based on these data, a ground truth-based crop yield prediction may be generated for the first geographic area at the crop cycle's end. Recommended operational change(s) may be identified based on distinct hypothetical crop yield prediction(s) for the first geographic area. Each distinct hypothetical crop yield prediction may be generated based on hypothetical operational data that includes altered data point(s) of the ground truth operational data.