The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2023
Filed:
Aug. 26, 2021
Canon Kabushiki Kaisha, Tokyo, JP;
Kosei Takahashi, Kanagawa, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Some embodiments are directed to an image processing apparatus comprising obtaining a reference image and a verification target image; selecting one or more defect detection processing from a plurality of types of defect detection processing for performing defect detection in the verification target image; executing the selected one or more defect detection processing on a difference image between the reference image and the verification target image in accordance with processing parameters of the selected one or more defect detection processing; and outputting a result display screen in which a defect in the verification target image and a defect detection processing used for detecting the defect can be identified, in a case where the defect is detected.