The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2023
Filed:
Aug. 08, 2018
University of Electronic Science and Technology of China, Sichuan, CN;
Huijuan Wu, Sichuan, CN;
Jiping Chen, Sichuan, CN;
Xiangrong Liu, Sichuan, CN;
Yao Xiao, Sichuan, CN;
Mengjiao Wang, Sichuan, CN;
Bo Tang, Sichuan, CN;
Mingru Yang, Sichuan, CN;
Haoyu Qiu, Sichuan, CN;
Yunjiang Rao, Sichuan, CN;
University of Electronic Science and Technology of China, Sichuan, CN;
Abstract
A 1D-CNN-based ((one-dimensional convolutional neural network)-based) distributed optical fiber sensing signal feature learning and classification method is provided, which solves a problem that an existing distributed optical fiber sensing system has poor adaptive ability to a complex and changing environment and consumes time and effort due to adoption of manually extracted distinguishable event features. The method includes steps of: segmenting time sequences of distributed optical fiber sensing acoustic and vibration signals acquired at all spatial points, and building a typical event signal dataset; constructing a 1D-CNN model, conducting iterative update training of the network through typical event signals in a training dataset to obtain optimal network parameters, and learning and extracting 1D-CNN distinguishable features of different types of events through an optimal network to obtain typical event signal feature sets; and after training different types of classifiers through the typical event signal feature sets, screening out an optimal classifier.