The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Mar. 14, 2019
Applicant:

Baidu Usa Llc, Sunnyvale, CA (US);

Inventor:

Min Guo, Sunnyvale, CA (US);

Assignee:

BAIDU USA LLC, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/063 (2006.01); G06F 16/901 (2019.01); G06F 9/00 (2006.01); G06F 7/544 (2006.01);
U.S. Cl.
CPC ...
G06N 3/063 (2013.01); G06F 7/5443 (2013.01); G06F 9/00 (2013.01); G06F 16/9024 (2019.01);
Abstract

Embodiments of the invention disclose an integrated circuit and a method for improving utilization of multiply and accumulate (MAC) units on the integrated circuit in an artificial intelligence (AI) engine. In one embodiment, the integrated circuit can include a scheduler for allocating the MAC units to execute a neural network model deployed on the AI engine to process input data. The scheduler includes status information for the MAC units, and can select one or more idle MAC units based on the status information for use to process the feature map slice. The integrated circuit can dynamically map idle MAC units to an input feature map, thereby improving utilization of the MAC units. A pair of linked list, each with a reference head, can be provided in a static random access memory (SRAM) to store only feature map slices and weights for a layer that is currently being processed. When processing a next layer, the two reference heads can be swapped so that output feature map slices for the current layer can be used as input feature maps for the next layer.


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