The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2023
Filed:
Dec. 17, 2019
Oracle International Corporation, Redwood Shores, CA (US);
Jingxiao Cai, Newark, CA (US);
Sandeep Agrawal, San Jose, CA (US);
Sam Idicula, Santa Clara, CA (US);
Venkatanathan Varadarajan, Seattle, WA (US);
Anatoly Yakovlev, Hayward, CA (US);
Nipun Agarwal, Saratoga, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
According to an embodiment, a method includes generating a first dataset sample from a dataset, calculating a first validation score for the first dataset sample and a machine learning model, and determining whether a difference in validation score between the first validation score and a second validation score satisfies a first criteria. If the difference in validation score does not satisfy the first criteria, the method includes generating a second dataset sample from the dataset. If the difference in validation score does satisfy the first criteria, the method includes updating a convergence value and determining whether the updated convergence value satisfies a second criteria. If the updated convergence value satisfies the second criteria, the method includes returning the first dataset sample. If the updated convergence value does not satisfy the second criteria, the method includes generating the second dataset sample from the dataset.