The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Aug. 22, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Mu Qiao, Belmont, CA (US);

Preethi Anantharaman, San Jose, CA (US);

Eric Kevin Butler, San Jose, CA (US);

Divyesh Jadav, San Jose, CA (US);

Nikolaos Anerousis, Los Gatos, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G06F 16/21 (2019.01); G06F 16/11 (2019.01); G06F 21/56 (2013.01); G06F 16/27 (2019.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06F 21/554 (2013.01); G06F 16/128 (2019.01); G06F 16/21 (2019.01); G06F 16/27 (2019.01); G06F 16/9027 (2019.01); G06F 21/566 (2013.01);
Abstract

Systems and methods are described for a data breach detection based on snapshot analytics. The described systems and methods identify a plurality of snapshots of a data structure, identify a plurality of leaf nodes of the data structure for each of the snapshots, generate a vector of data attributes for each of the leaf nodes, assign a weight to each of the vectors to produce a set of weighted vectors for each of the snapshots, compute a distance metric between each pair of the snapshots based on the corresponding sets of weighted vectors, and detect an abnormal snapshot among the plurality of snapshots based on the distance metrics.


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