The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Nov. 16, 2018
Applicant:

Netease (Hangzhou) Network Co., Ltd., Zhejiang, CN;

Inventors:

Xiang Li, Zhejiang, CN;

Jianjun Wang, Zhejiang, CN;

Xin Liu, Zhejiang, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3664 (2013.01);
Abstract

An automatic testing method and apparatus are provided. In the method, a Software Development Kit (SDK) interface is configured and User Interface (UI) rendering data which includes a plurality of UI controls is obtained through the SDK interface. The UI rendering data is a standardized data structure processed through the SDK interface. An operation event of a user on the UI rendering data is received, and a simulation operation of the user on the UI rendering data on a terminal device is determined according to the operation event. Position information of a UI control corresponding to the simulation operation is determined, and a UI automated test script is determined according to the position information and the simulation operation. The UI automated test script is run and debugged using an automated test framework.


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