The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2023
Filed:
Sep. 19, 2019
Sap SE, Walldorf, DE;
Dinesh Bhandarkar, Bangalore, IN;
Arpitha Shirdish, Bangalore, IN;
Sandeep Joy, Udupi, IN;
Shuva Ranjan Sen Sharma, Bangalore, IN;
SAP SE, Walldorf, DE;
Abstract
A testing scenario (forming part of a computing environment executing a plurality of applications) is initiated to characterize performance of the applications. During the execution of the testing scenario, various performance metrics associated with the applications are monitored. Thereafter, data characterizing the performance metrics is provided (e.g., displayed, loaded into memory, stored on disk, transmitted to a remote computing system, etc.). The testing scenario is generated by monitoring service calls being executed by each of a plurality of automates across the applications, generating a service request tree based on the monitored service calls for all of the applications, and removing cyclic dependencies in the service request tree such that reusable testing components are only used once. Related apparatus, systems, techniques and articles are also described.