The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2023
Filed:
Oct. 30, 2018
Life Technologies Corporation, Carlsbad, CA (US);
Terence Tak-Shing Tam, Redmond, WA (US);
Christopher Martin, Bothell, WA (US);
Frank Metting, Bothell, WA (US);
Jason Mecham, Snohomish, WA (US);
Robert Dain, Lynnwood, WA (US);
Larry Rystrom, Mill Creek, WA (US);
Paul Adrian Boeschoten, Redmond, CA (US);
Steven W. Lytle, Mill Creek, WA (US);
Other;
Abstract
Embodiments relate to systems and methods for sample image capture using integrated control. A digital microscope or other imaging device can be associated with a sample chamber containing cell, tissue, or other sample material. The chamber can be configured to operate using a variety of environmental variables, including gas concentration, temperature, humidity, and others. The imaging device can be configured to operate using a variety of imaging variables, including magnification, focal length, illumination, and others. A central system control module can be used to configure the settings of those hardware elements, as well as others, to set up and carry out an image capture event. The system control module can be operated to control the physical, optical, chemical, and/or other parameters of the overall imaging environment from one central control point. The variables used to produce the image capture can be configured to dynamically variable during the media capture event.