The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Jul. 27, 2020
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Jae-Chan Jong, Daejeon, KR;

Seung-Min Choi, Daejeon, KR;

Hyo-Bong Hong, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/12 (2006.01); G01R 33/34 (2006.01); A61B 5/0515 (2021.01);
U.S. Cl.
CPC ...
G01R 33/1276 (2013.01); G01R 33/34053 (2013.01); A61B 5/0515 (2013.01);
Abstract

Disclosed herein are an apparatus and method for imaging nano magnetic particles. The apparatus may include a measurement head in which a through hole for accommodating a sample including nano magnetic particles is formed and in which an excitation coil and a detection coil are installed, a field-free region generation unit for forming a field-free region, in which there are few or no magnetic fields, in a spacing area between the identical magnetic poles that face each other, and a control unit for applying a signal to the excitation coil when the measurement head is located inside the spacing area of the field-free region generation unit, controlling the field-free region so as to move in the sample, and imaging the 3D positional distribution of the nano magnetic particles included in the sample based on a detection signal output from the detection coil.


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