The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2023
Filed:
Dec. 22, 2020
Applicant:
Allegro Microsystems, Llc, Manchester, NH (US);
Inventors:
Ezequiel Rubinsztain, Buenos Aires, AR;
Pablo Javier Bolsinger, Buenos Aires, AR;
Assignee:
Allegro MicroSystems, LLC, Manchester, NH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/319 (2006.01); G01R 31/316 (2006.01); G01R 31/3167 (2006.01); G01R 31/3163 (2006.01);
U.S. Cl.
CPC ...
G01R 31/316 (2013.01); G01R 31/3163 (2013.01); G01R 31/3167 (2013.01); G01R 31/31926 (2013.01); G01R 31/318566 (2013.01); G01R 31/318569 (2013.01);
Abstract
A method for testing a signal path in a sensor, the signal path including a filter circuit and a comparator circuit, the method including: closing a first signal line that is arranged to bypass a first capacitor in the filter circuit; injecting a test signal into the signal path after the first signal line is closed; and detecting whether a signal that is output by the comparator circuit in response to the test signal satisfies a predetermined condition.