The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2023
Filed:
Oct. 16, 2020
Ionq, Inc., College Park, MD (US);
Neal Pisenti, Baltimore, MD (US);
Kenneth Wright, Berwyn Heights, MD (US);
Jason Madjdi Amini, Takoma Park, MD (US);
Jwo-Sy Chen, Greenbelt, MD (US);
IonQ, Inc., College Park, MD (US);
Abstract
Aspects of the present disclosure describe techniques for measuring collision rate with spatial filtering of scattered light. For example, a method for characterizing vacuum in a chamber is described that includes generating, inside the chamber, a potential well having a single, shallow potential region within which an ion is trapped, the shallow potential region having a lowest potential of the potential well, optically monitoring the ion within the potential well, detecting, based on the optically monitoring, a movement of the ion away from the shallow potential region in response to a collision with a background gas, and determining a pressure inside the chamber based on a rate of detected movements of the ion.