The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Aug. 23, 2019
Applicant:

Atlantic Inertial Systems Limited, Plymouth, GB;

Inventor:

Geoffrey Thomas Henderson, Yelverton, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/18 (2006.01); B64G 1/28 (2006.01); G01C 19/5719 (2012.01); G01C 21/16 (2006.01); G01C 25/00 (2006.01);
U.S. Cl.
CPC ...
G01C 21/18 (2013.01); B64G 1/28 (2013.01); G01C 19/5719 (2013.01); G01C 21/165 (2013.01); G01C 25/005 (2013.01);
Abstract

An inertial navigation system includes a first inertial measurement unit with at least a first sensor and a second inertial measurement unit with at least a second sensor corresponding in type to the first sensor. The first inertial measurement unit is rotatably mounted relative to the second inertial measurement unit, The inertial navigation system further include a controller arranged to: acquire a first set of measurements simultaneously from both the first inertial measurement unit and the second inertial measurement unit; rotate the first inertial measurement unit relative to the second inertial measurement unit; acquire a second set of measurements simultaneously from both the first inertial measurement unit and the second inertial measurement unit; and calculate from the first set of measurements and the second set of measurements at least one error characteristic of the first sensor and/or the second sensor.


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