The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Aug. 19, 2020
Applicant:

View, Inc., Milpitas, CA (US);

Inventors:

Fabian Strong, Hayward, CA (US);

Yashraj Bhatnagar, Santa Clara, CA (US);

Abhishek Anant Dixit, Collierville, TN (US);

Todd Martin, Mountain View, CA (US);

Robert T. Rozbicki, Los Gatos, CA (US);

Assignee:

View, Inc., Milpitas, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B32B 17/10 (2006.01); G02F 1/1523 (2019.01); G02F 1/155 (2006.01); H01B 13/00 (2006.01); C23C 14/08 (2006.01); G02B 1/18 (2015.01); G02F 1/153 (2006.01);
U.S. Cl.
CPC ...
B32B 17/10119 (2013.01); B32B 17/1099 (2013.01); B32B 17/10513 (2013.01); C23C 14/086 (2013.01); G02B 1/18 (2015.01); G02F 1/155 (2013.01); G02F 1/1523 (2013.01); G02F 1/1533 (2013.01); H01B 13/00 (2013.01); G02F 1/153 (2013.01); G02F 2001/1536 (2013.01); Y10T 29/49126 (2015.01);
Abstract

Thin-film devices, for example electrochromic devices for windows, and methods of manufacturing are described. Particular focus is given to methods of patterning optical devices. Various edge deletion and isolation scribes are performed, for example, to ensure the optical device has appropriate isolation from any edge defects. Methods described herein apply to any thin-film device having one or more material layers sandwiched between two thin film electrical conductor layers. The described methods create novel optical device configurations.


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