The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Aug. 19, 2020
Applicant:

View, Inc., Milpitas, CA (US);

Inventors:

Abhishek Anant Dixit, Collierville, TN (US);

Todd William Martin, Mountain View, CA (US);

Anshu A. Pradhan, Collierville, TN (US);

Fabian Strong, Hayward, CA (US);

Robert T. Rozbicki, Los Gatos, CA (US);

Assignee:

View, Inc., Milpitas, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/082 (2014.01); B23K 26/0622 (2014.01); H01L 27/144 (2006.01); G02F 1/153 (2006.01); B23K 26/402 (2014.01); B23K 26/57 (2014.01); B23K 26/08 (2014.01); B23K 26/38 (2014.01); E06B 9/24 (2006.01); B23K 26/361 (2014.01); G02F 1/1524 (2019.01); B32B 17/06 (2006.01); C03B 33/07 (2006.01); H01B 5/14 (2006.01); G02F 1/155 (2006.01); G02F 1/1523 (2019.01); B23K 103/16 (2006.01); B23K 103/18 (2006.01); B23K 101/40 (2006.01); B23K 103/00 (2006.01);
U.S. Cl.
CPC ...
B23K 26/0624 (2015.10); B23K 26/082 (2015.10); B23K 26/0846 (2013.01); B23K 26/361 (2015.10); B23K 26/38 (2013.01); B23K 26/402 (2013.01); B23K 26/57 (2015.10); B32B 17/06 (2013.01); C03B 33/076 (2013.01); E06B 9/24 (2013.01); G02F 1/153 (2013.01); G02F 1/155 (2013.01); G02F 1/1523 (2013.01); G02F 1/1524 (2019.01); G02F 1/1533 (2013.01); H01B 5/14 (2013.01); H01L 27/1443 (2013.01); B23K 2101/40 (2018.08); B23K 2103/172 (2018.08); B23K 2103/18 (2018.08); B23K 2103/54 (2018.08); E06B 2009/2464 (2013.01);
Abstract

Thin-film devices, for example electrochromic devices for windows, and methods of manufacturing are described. Particular focus is given to methods of patterning optical devices. Various edge deletion and isolation scribes are performed, for example, to ensure the optical device has appropriate isolation from any edge defects. Methods described herein apply to any thin-film device having one or more material layers sandwiched between two thin film electrical conductor layers. The described methods create novel optical device configurations.


Find Patent Forward Citations

Loading…