The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2023
Filed:
Jun. 04, 2018
Applicant:
Dexcom, Inc., San Diego, CA (US);
Inventors:
Apurv Ullas Kamath, San Diego, CA (US);
Ying Li, San Diego, CA (US);
Assignee:
Dexcom, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/1495 (2006.01); A61B 5/1486 (2006.01); A61B 5/145 (2006.01); G16H 10/60 (2018.01); G16Z 99/00 (2019.01); G16H 40/40 (2018.01);
U.S. Cl.
CPC ...
A61B 5/7207 (2013.01); A61B 5/1495 (2013.01); A61B 5/14532 (2013.01); A61B 5/14546 (2013.01); A61B 5/14865 (2013.01); A61B 5/6833 (2013.01); A61B 5/7203 (2013.01); A61B 5/7221 (2013.01); G16H 10/60 (2018.01); G16Z 99/00 (2019.02); G16H 40/40 (2018.01); Y02A 90/10 (2018.01);
Abstract
The present invention relates generally to systems and methods for measuring an analyte in a host. More particularly, the present invention relates to systems and methods for processing sensor data, including calculating a rate of change of sensor data and/or determining an acceptability of sensor or reference data.