The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2023

Filed:

Nov. 04, 2020
Applicant:

Kubota Corporation, Osaka, JP;

Inventors:

Takeru Ibuki, Amagazaki, JP;

Hirokazu Sasamoto, Amagazaki, JP;

Sakura Sasakura, Amagazaki, JP;

Yasuhiro Nishida, Sakai, JP;

Assignee:

KUBOTA CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A01F 15/08 (2006.01); G01N 33/00 (2006.01); A01F 15/07 (2006.01);
U.S. Cl.
CPC ...
A01F 15/08 (2013.01); G01N 33/0098 (2013.01); A01F 15/07 (2013.01);
Abstract

A yield calculation system comprises a position sensor configured to detect a position. A baler comprises a bale chamber in which crop material is to be formed into a bale, a volume measurement sensor provided in the bale chamber and configured to measure a volume of the bale in the bale chamber, the volume corresponding to the position detected by the position sensor, and a moisture measurement sensor provided in the bale chamber and configured to measure a moisture amount in the bale, the moisture amount corresponding to the position detected by the position sensor. Circuitry is configured to calculate, based on the volume of the bale and the moisture amount corresponding to the position, a yield corresponding to the position by excluding the moisture amount from an amount of the bale.


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