The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

May. 20, 2021
Applicant:

Genesys Logic, Inc., New Taipei, TW;

Inventor:

Ching-Hsiang Lin, New Taipei, TW;

Assignee:

GENESYS LOGIC, INC., New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); H04L 25/00 (2006.01); H04L 25/40 (2006.01); H04N 5/04 (2006.01); G06F 13/42 (2006.01);
U.S. Cl.
CPC ...
H04N 5/04 (2013.01); G06F 13/4282 (2013.01); H04L 7/00 (2013.01); H04L 7/002 (2013.01); H04L 7/0025 (2013.01); H04L 7/0029 (2013.01);
Abstract

A method of reading data includes: receiving a digital signal, wherein the digital signal includes a sync signal and a data signal; performing an oversampling operation to the digital signal, and calculating a plurality of sampling points according to the oversampling operation; by a first counter counting the sampling points to obtain a first count value; based on the first count value defining a second count value; defining a unit interval; in the unit interval, defining a data reading range; and in the data reading range, reading the data signal corresponding to data of the unit interval as a first value when a potential of each of the sampling points counted is changed from a first potential to a second potential.


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