The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

Feb. 20, 2018
Applicant:

Akoustis, Inc., Huntersville, NC (US);

Inventors:

Shawn R. Gibb, Huntersville, NC (US);

Steven Denbaars, Goleta, CA (US);

Jeffrey B. Shealy, Cornelius, NC (US);

Assignee:

Akoustis, Inc., Huntersville, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 41/319 (2013.01); H01L 41/08 (2006.01); H01L 41/18 (2006.01); H01L 41/316 (2013.01); C30B 25/18 (2006.01); C30B 23/02 (2006.01); C30B 29/40 (2006.01); C30B 31/06 (2006.01); H01L 41/338 (2013.01); H01L 41/29 (2013.01); H01L 41/332 (2013.01); H01L 41/331 (2013.01); H01L 41/23 (2013.01);
U.S. Cl.
CPC ...
H01L 41/319 (2013.01); C30B 23/025 (2013.01); C30B 25/183 (2013.01); C30B 29/403 (2013.01); C30B 31/06 (2013.01); H01L 41/0815 (2013.01); H01L 41/18 (2013.01); H01L 41/316 (2013.01); H01L 41/23 (2013.01); H01L 41/29 (2013.01); H01L 41/331 (2013.01); H01L 41/332 (2013.01); H01L 41/338 (2013.01);
Abstract

A method of manufacture and resulting structure for a single crystal electronic device with an enhanced strain interface region. The method of manufacture can include forming a nucleation layer overlying a substrate and forming a first and second single crystal layer overlying the nucleation layer. This first and second layers can be doped by introducing one or more impurity species to form a strained single crystal layers. The first and second strained layers can be aligned along the same crystallographic direction to form a strained single crystal bi-layer having an enhanced strain interface region. Using this enhanced single crystal bi-layer to form active or passive devices results in improved physical characteristics, such as enhanced photon velocity or improved density charges.


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