The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

Aug. 24, 2021
Applicant:

Korea Institute of Science and Technology, Seoul, KR;

Inventors:

Yoon Seon Oh, Seoul, KR;

Ho Yeon Hwang, Seoul, KR;

Sung Kee Park, Seoul, KR;

Chang Joo Nam, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 30/262 (2022.01); G06K 9/62 (2022.01); G06T 7/77 (2017.01); G06V 20/10 (2022.01); G06V 20/64 (2022.01);
U.S. Cl.
CPC ...
G06V 30/274 (2022.01); G06K 9/6222 (2013.01); G06K 9/6232 (2013.01); G06K 9/6253 (2013.01); G06K 9/6278 (2013.01); G06T 7/77 (2017.01); G06V 20/10 (2022.01); G06V 20/64 (2022.01); G06T 2207/20076 (2013.01);
Abstract

The system includes a metric map creation unit configured to create a metric map using first image data received from a 3D sensor, an image processing unit configured to recognize an object by creating and classifying a point cloud using second image data received from an RGB camera; a probability-based map production unit configured to create an object location map and a spatial semantic map in a probabilistic expression method using a processing result of the image processing unit, a question creation unit configured to extract a portion of high uncertainty about an object class from a produced map on the basis of entropy and ask a user about the portion, and a map update unit configured to receive a response from the user and update a probability distribution for spatial information according to a change in probability distribution for classification of the object.


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