The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2023
Filed:
Dec. 10, 2018
Applicant:
Boe Technology Group Co., Ltd., Beijing, CN;
Inventor:
Heliang Di, Beijing, CN;
Assignee:
BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD., Beijing, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/24 (2022.01); G06F 1/16 (2006.01); G06F 3/041 (2006.01); G06T 7/30 (2017.01); G06T 7/73 (2017.01); G06T 19/00 (2011.01); G01M 11/02 (2006.01); G06T 7/80 (2017.01); G06F 11/22 (2006.01); H04N 17/00 (2006.01); G06F 3/01 (2006.01);
U.S. Cl.
CPC ...
G06V 10/242 (2022.01); G06F 1/163 (2013.01); G06F 3/013 (2013.01); G06F 3/0416 (2013.01); G06T 7/30 (2017.01); G06T 7/73 (2017.01); G06T 19/006 (2013.01); G06V 10/243 (2022.01);
Abstract
Disclosed are a method and system for testing a wearable device. The method includes: performing an angle acquisition process for at least two times, and calculating an optical imaging parameter value of a target virtual image on the basis of angle variation values acquired in the at least two angle acquisition processes. With the method and system according to the present disclosure, the finally calculated optical imaging parameter value is more objective and more accurate than that acquired by means of the human eyes.