The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2023
Filed:
Feb. 10, 2021
Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;
Jianwei Fu, Shanghai, CN;
SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD., Shanghai, CN;
Abstract
A method for determining at least one artifact calibration coefficient is provided. The method may include obtaining preliminary projection values of a first object. The radiation rays may be detected by at least one radiation detector. The method may further include generating a preliminary image of the first object based on the preliminary projection values of the first object and generating calibrated projection values of the first object based on the preliminary image. The method may further include determining a relationship between the preliminary projection values and the calibrated projection values. The method may further include, for each of the at least one radiation detector, determining a location of the radiation detector and determining an artifact calibration coefficient corresponding to the radiation detector based on the relationship between the preliminary projection values and the calibrated projection values and the location of the radiation detector.