The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2023
Filed:
Jul. 29, 2020
Oracle International Corporation, Redwood Shores, CA (US);
Sonali Vijay Inamdar, Redwood City, CA (US);
Simon Chow, San Francisco, CA (US);
Carlos E. Hernández-Rincón, Zapopan, MX;
Carolina Elizabeth Elias Arenas, Ecatepec de Morelos, MX;
ORACLE INTERNATIONAL CORPORATION, Redwood Shores, CA (US);
Abstract
In some examples a first parameter for respective applicants or candidates can be computed based on respective text data from a text dataset that can include a plurality of different types of text data. The first parameter can be populated with a given portion of text of the respective text data. A second parameter for a job requisition can be computed based on the respective text data used to compute the first parameter for a given applicant or candidate. The second parameter can be populated with a different portion of text of the respective text data used to compute the first parameter. Synthetic test data can be generated based on the computed parameters to test a machine learning (ML) ranking model that has been trained on training data that is from a different data source than the text dataset to validate a performance of the ML ranking model.