The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

May. 22, 2020
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Rajendra Kumar, Bangalore, IN;

Rahul Choudhary, Samastipur, IN;

Seshadri Chatterjee, Kolkata, IN;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06K 9/62 (2022.01); G06N 3/08 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06K 9/6262 (2013.01); G06N 3/088 (2013.01); G06N 3/0454 (2013.01); G06N 3/082 (2013.01);
Abstract

A machine learning model including an autoencoder may be trained based on training data that includes sequences of non-anomalous performance metrics from an information technology system but excludes sequences of anomalous performance metrics. The trained machine learning model may process a sequence of performance metrics from the information technology system by generating an encoded representation of the sequence of performance metrics and generating, based on the encoded representation, a reconstruction of the sequence of performance metrics. An occurrence of the anomaly at the information technology system may be detected based on a reconstruction error present in reconstruction of the sequence of performance metrics. Related systems, methods, and articles of manufacture are provided.


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