The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

May. 14, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Adrian Vrouwenvelder, Chapel Hill, NC (US);

Stephen Alan Carraway, Durham, NC (US);

John Hefferman, Durham, NC (US);

Kimberly Diane Kenna, Cary, NC (US);

Assignee:

MERATIVE US L.P., Ann Arbor, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); G06N 5/02 (2006.01); G06N 20/00 (2019.01); G16H 10/20 (2018.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06N 5/025 (2013.01); G06K 9/6215 (2013.01); G06K 9/6256 (2013.01); G06N 20/00 (2019.01); G16H 10/20 (2018.01);
Abstract

A method, computing platform, and computer program product are provided. A computing platform receives, for a clinical trial, study design information including a set of parameters related to a success of a clinical trial and factors related to a relevance of the parameters. The computing platform provides multiple sets of varying parameter values. At least one trained machine learning model is applied to the study design information including the sets of parameter values to predict multiple success scores including a predicted overall success score. The computing platform outputs the provided set of values for the set of parameters that are associated with the at least one trained machine learning model predicting a best overall success score for the clinical trial.


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