The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

Mar. 08, 2017
Applicant:

Educational Testing Service, Princeton, NJ (US);

Inventors:

Vikram Ramanarayanan, San Francisco, CA (US);

Saad Khan, Yardley, PA (US);

Assignee:

Educational Testing Service, Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/00 (2006.01); G06N 20/00 (2019.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06N 3/006 (2013.01); G06F 16/22 (2019.01); G06N 20/00 (2019.01);
Abstract

Systems and methods for computer-implemented evaluation of a performance are provided. In a first aspect, a computer-implemented method of evaluating an interaction generates a first temporal record of first behavior features exhibited by a first entity during an interaction between a first entity and a second entity. A second temporal record is generated including second behavior features exhibited by a second entity during an interaction with a first entity. A determination is made that a first feature of a first temporal record is associated with a second feature of a second temporal record. The length of time that passes between the first feature and second feature is evaluated, and a determination is made that the length of time satisfies a temporal condition. A co-occurrence record associated with a first feature and a second feature is generated and included in a co-occurrence record data-structure.


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