The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

Jan. 11, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Namit Kabra, Hyderabad, IN;

Ritesh Kumar Gupta, Hyderabad, IN;

Ron Reuben, San Ramon, CA (US);

Vijay Ekambaram, Chennai, IN;

Smitkumar Narotambhai Marvaniya, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/25 (2019.01); G06F 16/23 (2019.01); G06N 20/00 (2019.01); G06F 16/215 (2019.01); G06F 16/951 (2019.01);
U.S. Cl.
CPC ...
G06F 16/254 (2019.01); G06F 16/215 (2019.01); G06F 16/2365 (2019.01); G06F 16/951 (2019.01); G06N 20/00 (2019.01);
Abstract

A computer-implemented method applies insights from a variety of data sources to each of the data sources. The method includes identifying a set of data sources, wherein each of the data sources are associated with a domain. The method includes analyzing documentation for each of the data sources. The method further includes extracting a set of attributes for each data source, and determining a data schema associated with each data source. The method includes mapping each data schema to a common domain schema. The method also includes linking, based on the mapping and on the set of attributes for each data source, common features across each data source. The method includes generating, in response to the linking, a knowledge graph. The method further includes preparing a visual display for a set of domain insights; and forking the set of domain insights into a first data source.


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