The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2023
Filed:
Nov. 12, 2020
Oracle International Corporation, Redwood Shores, CA (US);
James Hartsing, Nashua, NH (US);
Raghuram Venkatasubramanian, Cupertino, CA (US);
Ekrem S. C. Soylemez, Lexington, MA (US);
Anne Murphy, Cambridge, MA (US);
Scott Feinstein, Orlando, FL (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Herein are techniques for automatically leveraging metadata of an analytic view to accelerate a relational query. In an embodiment, a computer stores model metadata that defines an analytic view that contains a join operation that is based on a dimension column of a dimension table and a join column of a fact table. The analytic view also contains a measure that is based on an aggregation operation and a measure column of the fact table. Also stored is denormalization metadata that defines a transparency view that is based on the analytic view. In operation, a query that references the transparency view is received. The query does not reference the analytic view. The query that references the transparency view is executed based on: a) the denormalization metadata that defines the transparency view, b) the model metadata that defines the analytic view, and c) the measure that is based on the aggregation operation and the measure column of the fact table.