The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

Oct. 14, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Shao Rong Il Li, Beijing, CN;

Cheng Luo, Beijing, CN;

Lan Cao, Beijing, CN;

Cheng Cheng Dong, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/21 (2019.01); G06F 16/901 (2019.01); G06F 16/182 (2019.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/212 (2019.01); G06F 16/182 (2019.01); G06F 16/2228 (2019.01); G06F 16/9024 (2019.01);
Abstract

A method, system and computer program product for processing metrics data with graph data context analysis. Graph data representing one or more devices or sensors is stored into a first database, and metrics data generated by the devices or sensors is stored in a second database. The metrics data is then applied to the graph data for the context analysis, wherein the context analysis reflects the relationships of the devices or sensors in the graph data to the metrics data generated by the devices or sensors. The graph data comprises nodes for representing the devices or sensors, edges for representing a topology of the devices or sensors, and properties for storing the metrics data associated with the nodes and edges; and the metrics data comprises time-series data that is logged by the devices and sensors.


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