The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

Aug. 19, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

James Bonanno, Liberty Hill, TX (US);

Adam Benjamin Collura, Hopewell Junction, NY (US);

Edward Thomas Malley, Eastchester, NY (US);

Brian Robert Prasky, Campbell Hall, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/0855 (2016.01); G06F 12/0897 (2016.01); G06F 9/38 (2018.01);
U.S. Cl.
CPC ...
G06F 12/0855 (2013.01); G06F 9/3842 (2013.01); G06F 12/0897 (2013.01); G06F 2212/466 (2013.01); G06F 2212/6032 (2013.04);
Abstract

Embodiments are provided for an integrated semi-inclusive hierarchical metadata predictor. A hit in a second-level structure is determined, the hit being associated with a line of metadata in the second-level structure. Responsive to determining that a victim line of metadata in a first-level structure meets at least one condition, the victim line of metadata is stored in the second-level structure. The line of metadata from the second-level structure is stored in a first-level structure to be utilized to facilitate performance of a processor, the line of metadata from the second-level structure including entries for a plurality of instructions.


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