The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

Nov. 19, 2021
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Kadekoppa Kiran Rohithakshappa, Waxhaw, NC (US);

Amit Mishra, Chennai, IN;

Silpa Edappilly Santhosh, Chennai, IN;

Richa Soni, Chennai, IN;

Krithika Viswanathan, Chennai, IN;

Assignee:

BANK OF AMERICA CORPORATION, Charlotte, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/34 (2006.01); G06F 8/75 (2018.01);
U.S. Cl.
CPC ...
G06F 11/3404 (2013.01); G06F 8/75 (2013.01); G06F 11/3466 (2013.01);
Abstract

Embodiments of the invention are directed to static program code analysis and detection of architectural flaws. The system provides a rule-based anomaly detection engine structured to capture application logs during construction of technology program code and dynamically detect anti-pattern conflicts to remediate defects in the technology program code. In particular, the system receives a request to perform defect analysis of a first technology program code. In response, the system constructs a first layer transition map based on mapping each of a plurality of first classes associated with the first technology program code to one or more application layers. The system may then determine, via an anomaly detection engine component, one or more anomalies associated with the first technology program code.


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