The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2023
Filed:
Apr. 15, 2021
Oracle International Corporation, Redwood Shores, CA (US);
Tao Mao, Castro Valley, CA (US);
Yanfei Fan, Fremont, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A degree of fragmentation is determined based on a number of holes present in a storage system layout or a portion of a layout. Edges between the holes and used portions of the storage system are tabulated by scanning a storage space. The occurrences of a pattern of used/available allocation units and/or the occurrences of another pattern available/used allocation units are recognized. A fragmentation value is calculated based on occurrences of the patterns in view of the total storage space. The present fragmentation measurement system utilizes the number of occurrences of the holes in assessing fragmentation.