The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2023
Filed:
May. 19, 2021
Evident Corporation, Nagano, JP;
Motohiro Shibata, Tokyo, JP;
Takehiko Hayashi, Tokyo, JP;
Keita Kojima, Tokyo, JP;
Keigo Mori, Tokyo, JP;
Evident Corporation, Nagano, JP;
Abstract
A microscope system is provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification, and a processor. The processor is configured to specify a type of a container in which a specimen is placed, and when starting observation of the specimen placed in the container at the second magnification, the processor is configured to specify an observation start position by performing object detection according to the type of container on a first image that includes the container acquired by the microscope at the first magnification, and control a relative position of the microscope with respect to the specimen such that the observation start position is contained in a field of view at the second magnification of the microscope.