The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2023
Filed:
May. 21, 2021
Applicant:
The Texas A&m University System, College Station, TX (US);
Inventor:
Vladislav V. Yakovlev, College Station, TX (US);
Assignee:
THE TEXAS A&M UNIVERSITY SYSTEM, College Station, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/16 (2006.01); G01J 3/28 (2006.01); G02B 21/18 (2006.01); G02B 21/08 (2006.01);
U.S. Cl.
CPC ...
G02B 21/16 (2013.01); G01J 3/2823 (2013.01); G02B 21/08 (2013.01); G02B 21/18 (2013.01);
Abstract
A spectroscopy device includes an incoherent light source, tunable to a predetermined emission wavelength; a microscope platform comprising a microscope objective comprising a deep-UV optimized objective and a focal plane defined thereon; a notch filter having an absorption frequency matched to the emission wavelength; and a frequency-selective optical path from the wide-field UV light source to the microscope platform onto the focal plane and from the focal plane through the notch filter.