The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2023
Filed:
Mar. 04, 2021
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Michael Guentert, Heerbrugg, CH;
Ulrich Weiger, Montlingen, CH;
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Abstract
Examples relate to a microscope system comprising a Light-Emitting Diode (LED)-based illumination system and at least one image sensor assembly, and to a corresponding system, method and computer program. The LED-based illumination system is configured to emit radiation power having at least one peak at a wavelength that is tuned to an excitation wavelength of at least one fluorescent material and/or to emit radiation power across a white light spectrum, with the light emitted across the white light spectrum being filtered such that light having a wavelength spectrum that coincides with at least one fluorescence emission wavelength spectrum of the at least one fluorescent material is attenuated or blocked. The at least one image sensor assembly is configured to generate image data, with the image data (at least) representing light reflected by a sample that is illuminated by the LED-based illumination system. The microscope system comprises one or more processors, configured to process the image data to generate processed image data.