The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

Aug. 30, 2019
Applicant:

Namuga Co., Ltd., Seongnam-si, KR;

Inventors:

Jun Youb Lee, Seongnam-si, KR;

Ji Soo Won, Yongin-si, KR;

Jung Ho Lee, Seoul, KR;

Young Gyu Kang, Yongin-si, KR;

Jeong Hwa Seo, Seongnam-si, KR;

Assignee:

Namuga Co., Ltd., Seingnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/48 (2006.01); G01S 7/497 (2006.01); G01S 17/08 (2006.01); G01S 7/481 (2006.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G01S 7/497 (2013.01); G01S 7/4814 (2013.01); G01S 17/08 (2013.01); G01S 17/89 (2013.01);
Abstract

Disclosed is a system including: a beam projector module comprising a light source and an optical device configured to diffuse light output from the light source to reduce an intensity of the light; an image sensor configured to receive reflected light formed by the light reflected from an object; and a signal processing device configured to measure a distance from the object by analyzing a characteristic of the reflected light, wherein the signal processing device operates the beam projector module in an eye-safety mode when the characteristic of the reflected light corresponds to a crack characteristic.


Find Patent Forward Citations

Loading…