The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2023
Filed:
Mar. 26, 2019
Applicant:
Jfe Steel Corporation, Tokyo, JP;
Inventors:
Naoshi Yamahira, Tokyo, JP;
Toshiki Tsuboi, Tokyo, JP;
Assignee:
JFE Steel Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01N 21/27 (2006.01); G01N 21/84 (2006.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01N 21/27 (2013.01); G01N 2021/845 (2013.01); G01N 2021/8592 (2013.01);
Abstract
A fine ratio measuring device that measures a ratio of fines adhering to the surface of a material in the form of lumps, the fine ratio measuring device includes: an illumination unit that illuminates the material in the form of lumps; a spectrometer that performs spectral analysis on light reflected from the material in the form of lumps to measure spectral reflectance; and an arithmetic device that extracts at least one feature quantity from the spectral reflectance measured by the spectrometer and computes the fine ratio from the extracted at least one feature quantity.