The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2023

Filed:

Apr. 03, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Te Tang, Fremont, CA (US);

Tetsuaki Kato, Fremont, CA (US);

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); G06F 17/16 (2006.01); G06T 17/00 (2006.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
B25J 9/1697 (2013.01); B25J 9/161 (2013.01); B25J 9/1669 (2013.01); G06F 17/16 (2013.01); G06T 7/70 (2017.01); G06T 17/00 (2013.01);
Abstract

A system and method for extracting features from a 2D image of an object using a deep learning neural network and a vector field estimation process. The method includes extracting a plurality of possible feature points, generating a mask image that defines pixels in the 2D image where the object is located, and generating a vector field image for each extracted feature point that includes an arrow directed towards the extracted feature point. The method also includes generating a vector intersection image by identifying an intersection point where the arrows for every combination of two pixels in the 2D image intersect. The method assigns a score for each intersection point depending on the distance from each pixel for each combination of two pixels and the intersection point, and generates a point voting image that identifies a feature location from a number of clustered points.


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