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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11554376 B1

PDFFull Text
Date of Patent:
Jan. 17, 2023

Filed:

Dec. 07, 2017

Container and calibration standard plate

Applicant:

Ricoh Company, Ltd., Tokyo, JP;

Inventors:

Ryuya Mashiko, Tokyo, JP;

Satoshi Izumi, Tokyo, JP;

Hiroki Somada, Shizuoka, JP;

Takahiko Matsumoto, Kanagawa, JP;

Daisuke Takagi, Kanagawa, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:

Grüneberg and Myers PLLC

Primary Examiner:

Christine T Mui

Assistant Examiner:

Emily R Berkeley

Int. Cl.
CPC ...
B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
B01L 3/5085 (2013.01); B01L 2200/148 (2013.01); B01L 2300/021 (2013.01); B01L 2300/024 (2013.01); B01L 2300/0829 (2013.01); B01L 2300/0861 (2013.01);
Abstract

Provided is a container () including a base material () including a plurality of concave portions (); a recognition unit () disposed on the base material and configured to recognize the base material; and a storage unit () disposed in a position other than a measurement region of the base material and configured to store information on biomaterials contained in the plurality of concave portions, wherein the recognition unit and the storage unit are allowed to correspond to each other.

Find Patent Forward Citations

Mashiko, Ryuya. (2023). Container and calibration standard plate (U.S. Patent No. 11554376). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11554376

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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