The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Feb. 25, 2021
Applicant:

Gracenote, Inc., Emeryville, CA (US);

Inventors:

Wilson Harron, Berkeley, CA (US);

Irene Zhu, San Francisco, CA (US);

Assignee:

Gracenote, Inc., Emeryville, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/00 (2022.01); G06V 10/44 (2022.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01); G06V 10/26 (2022.01); G06V 30/148 (2022.01); G06V 30/10 (2022.01);
U.S. Cl.
CPC ...
G06V 10/443 (2022.01); G06N 3/0445 (2013.01); G06N 3/0454 (2013.01); G06N 3/0472 (2013.01); G06N 3/0481 (2013.01); G06N 3/08 (2013.01); G06V 10/26 (2022.01); G06V 10/454 (2022.01); G06V 30/153 (2022.01); G06V 30/10 (2022.01);
Abstract

In one aspect, an example method includes a processor (1) applying a feature map network to an image to create a feature map comprising a grid of vectors characterizing at least one feature in the image and (2) applying a probability map network to the feature map to create a probability map assigning a probability to the at least one feature in the image, where the assigned probability corresponds to a likelihood that the at least one feature is an overlay. The method further includes the processor determining that the probability exceeds a threshold, and responsive to the processor determining that the probability exceeds the threshold, performing a processing action associated with the at least one feature.


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