The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2023
Filed:
May. 24, 2021
Crescom Co., Ltd., Gyeonggi-do, KR;
Jae Joon Lee, Gyeonggi-do, KR;
CRESCOM CO., LTD., Gyeonggi-Do, KR;
Abstract
The present disclosure relates to an image analysis method, system, and computer program. The image analysis method of the present disclosure includes: receiving a query image; extracting one or more regions of interest from the query image; calculating a first feature for each of the regions of interest by respectively applying the regions of interest to one or more ROI (region of interest) feature extraction models independently learned in order to extract features of the regions of interest; and calculating analysis values of the query image by applying the first features of the regions of interest to a pre-learned integration analysis model. According to the present disclosure, it is possible to reduce the influence on an analysis model by an error that training data created for map learning of an entire image may have, and it is also possible to increase learning accuracy and objectivity of a deep neural network.