logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11551350 B1

PDFFull Text
Date of Patent:
Jan. 10, 2023

Filed:

Feb. 11, 2021

Inspecting for a defect on a print medium with an image aligned based on an object in the image and based on vertices of the inspection target medium and the reference medium

Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Toshiyuki Ishii, Tokyo, JP;

Toshihiro Kobayashi, Tokyo, JP;

Assignee:

CANON KABUSHIKI KAISHA, Tokyo, JP;

Attorney:

Rossi, Kimms & McDowell LLP

Primary Examiner:

Christopher Wait

Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/33 (2017.01); G06K 15/02 (2006.01); G06K 15/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06K 15/027 (2013.01); G06K 15/408 (2013.01); G06T 7/337 (2017.01); G06T 2207/20212 (2013.01); G06T 2207/30144 (2013.01); G06T 2207/30204 (2013.01);
Abstract

There is provided with an image processing apparatus. An obtaining unit obtains a first image serving as a read image of an inspection target medium having undergone printing, and a second image serving as a read image of a reference medium representing a target print result. An inspection unit inspects a defect on the inspection target medium based on the first image and the second image by performing inspection at inspection settings different between a print region and a peripheral region of the inspection target medium.

Find Patent Forward Citations

Ishii, Toshiyuki. (2023). Inspecting for a defect on a print medium with an image aligned based on an object in the image and based on vertices of the inspection target medium and the reference medium (U.S. Patent No. 11551350). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11551350

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…