The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Mar. 06, 2018
Applicant:

Southeast University, Jiangsu, CN;

Inventors:

Jian Zhang, Jiangsu, CN;

Futao Ni, Jiangsu, CN;

Assignee:

SOUTHEAST UNIVERSITY, Jiangsu, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/70 (2017.01); G06T 5/00 (2006.01); G06T 5/20 (2006.01); G06T 7/80 (2017.01); G06T 7/136 (2017.01); G06T 7/62 (2017.01); G01B 11/02 (2006.01); G01N 33/38 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01B 11/022 (2013.01); G01N 33/383 (2013.01); G06T 5/002 (2013.01); G06T 5/20 (2013.01); G06T 7/136 (2017.01); G06T 7/62 (2017.01); G06T 7/70 (2017.01); G06T 7/80 (2017.01); G06T 11/00 (2013.01); G06T 2207/30132 (2013.01); G06T 2207/30244 (2013.01);
Abstract

The present invention discloses a method and device for automatically drawing structural cracks and precisely measuring widths thereof. The method comprises a method for automatically drawing cracks and a method for calculating widths of these cracks based on a single-pixel skeleton and Zernike orthogonal moments, wherein the method for automatically drawing cracks is used to rapidly and precisely draw cracks in the surface of a structure, and the method for calculating widths of these cracks based on a single-pixel skeleton and Zernike orthogonal moments is used to calculate widths of macro-cracks and micro-cracks in an image in a real-time manner.


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