The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Jun. 17, 2020
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Bing Yu, Hangzhou, CN;

Chuanxia Zheng, Shenzhen, CN;

Bailan Feng, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4053 (2013.01); G06T 3/4046 (2013.01); G06T 5/003 (2013.01); G06T 5/50 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Embodiments of this application provide an image reconstruction method and device. The method includes: inputting a first image into a newly constructed super-resolution model to obtain a reconstructed second image, where a resolution of the second image is higher than that of the first image. The newly constructed super-resolution model is obtained by training an initial super-resolution model by using an error loss. The error loss includes a pixel mean square error and an image feature mean square error. The image feature in the image feature mean square error includes at least one of a texture feature, a shape feature, a spatial relationship feature, and an image high-level semantic feature. According to the embodiments of this application, the quality of a reconstructed image can be improved.


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