The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Apr. 20, 2020
Applicant:

The Climate Corporation, San Francisco, CA (US);

Inventors:

Lijuan Xu, Foster City, CA (US);

Ying Xu, Boston, MA (US);

Ankur Gupta, San Francisco, CA (US);

Assignee:

CLIMATE LLC, San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G06Q 50/02 (2012.01); A01B 79/00 (2006.01); A01C 21/00 (2006.01);
U.S. Cl.
CPC ...
G06Q 50/02 (2013.01); A01B 79/005 (2013.01); A01C 21/00 (2013.01); G06Q 10/067 (2013.01); G06Q 10/06315 (2013.01);
Abstract

A computer implemented method for generating digital models of relative crop yield based on nitrate values in the soil is provided. In an embodiment, nitrate measurements from soil during a particular portion of a crop's development and corresponding crop yields are received by an agricultural intelligence computing system. Based, at least in part, on the nitrate measurements and corresponding crop yields, the system determines maximum yields for each location of a plurality of locations. The system then converts each crop yield value into a relative crop yield by dividing the crop yield value by the maximum crop yield for the location. Using the relative crop yields and the corresponding nitrate values in the soil, the system generates a digital model of relative crop yield as a function of nitrate in the soil during the particular portion of the crop's development. When the system receives nitrate measurements from soil in a particular field during the particular portion of a crop's development, the system computes a relative yield value for the particular field using the model of relative crop yield.


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