The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Sep. 29, 2018
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Chao Hua Wu, Beijing, CN;

Cong Chao Li, Jiangsu, CN;

Daniel Schneegass, Beijing, CN;

Ruo Gu Sheng, Beijing, CN;

Peng Wei Tian, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/06313 (2013.01);
Abstract

An industrial device matching method and apparatus are used for acquiring a corresponding relationship between industrial devices in different industrial data sources to provide basis for industrial data analysis. The method, in an embodiment, includes collecting data of at least two industrial data sources; determining a first relationship between various industrial devices in each industrial data source, and determining a first relationship topology between the industrial devices in the industrial data source; and comparing the first relationship topologies corresponding to various industrial data sources, to determine a first corresponding relationship between industrial devices in industrial data sources, the first corresponding relationship enabling the first relationship topologies corresponding to at least two industrial data sources to be similar. A relationship between industrial devices in different industrial data sources is determined by comparing a relationship topology between devices according to the similarity of relationships between the devices in different industrial data sources.


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