The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2023
Filed:
Oct. 31, 2018
Royal Bank of Canada, Montreal, CA;
Weiguang Ding, Toronto, CA;
Ruitong Huang, Toronto, CA;
Luyu Wang, Toronto, CA;
Yanshuai Cao, Toronto, CA;
ROYAL BANK OF CANADA, Montreal, CA;
Abstract
A method for acquiring measurements for a data structure corresponding to an array of variable includes: selecting a subset of elements from the data structure; measuring a sampled value for each of the selected subset of elements; storing each of the sampled values in a K-nearest neighbour (KNN) database and labelling the sampled value as certain; generating a predicted value data structure where each predicted element is generated as the value of its nearest neighbor based on the values stored in the KNN database; for each predicted element: retrieve the predicted element's X nearest neighbours for the sampled value in the KNN database, and when a value of the X nearest neighbours is the same as the predicted element, the predicted element is labelled as certain, otherwise the predicted element is labelled the values as uncertain; and repeating until all elements are labelled as certain.