The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Apr. 20, 2021
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Arnab Roy, Santa Clara, CA (US);

Hart Montgomery, Redwood City, CA (US);

Avradip Mandal, Sunnyvale, CA (US);

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/62 (2013.01); H04L 9/08 (2006.01); G06F 21/60 (2013.01);
U.S. Cl.
CPC ...
G06F 21/6227 (2013.01); G06F 21/602 (2013.01); H04L 9/0825 (2013.01);
Abstract

A method may include exchanging a secret symmetric key (SSK) between a first trusted execution environment (TEE) of a first system, a second TEE of a second system and a third TEE of a third system. The method may also include receiving, by the first system, an encrypted first set of data from the second system. The method may also include decrypting, by the first TEE, the encrypted first set of data using the SSK. The method may also include receiving, by the first system, an encrypted query from the third system. The method may also include decrypting, by the first TEE, the encrypted query using the SSK. The method may also include determining, by the first TEE, a query result to the decrypted query using index sets. The method may also include sending, by the first TEE, the encrypted query result to the third system.


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