The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Jun. 18, 2019
Applicant:

Rolls-royce Deutschland Ltd & CO KG, Blankenfelde-Mahlow, DE;

Inventor:

Christian Stanek, Marquartstein, DE;

Assignee:

Rolls-Royce Deutschland Ltd & Co KG, Blankenfelde-Mahlow, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 16/28 (2019.01); G06F 16/2457 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/284 (2019.01); G06F 16/2358 (2019.01); G06F 16/2365 (2019.01); G06F 16/24573 (2019.01);
Abstract

The invention relates to a processing, i.e. storing and analyzing, of measurement data. In order to store the measurement data, respective data units or data sets are created for sampling points, a plurality of measurement data temporally adjacent to the sampling-point measurement datum being stored within the data unit. A time interval between time values of the sampling-point measurement data of two consecutive data units at least is set approximately to a multiple of a sampling time interval, i.e. of a reciprocal of the measurement-value recording rate or sampling rate. The method according to the invention reduces the provision of data units because an individual data unit contains, in addition to a sampling-point measurement date, further measurement data temporally adjacent to the sampling-point measurement date. This measure reduces the management of data sets that is required in a database approximately by a factor which corresponds to the number of measurement data within the data unit designed according to the invention.


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