The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

May. 05, 2020
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Vineeth Chandran Poovathikkal, Bangalore, IN;

Sangeeth Divakaran, Bangalore, IN;

David John Edwards, Jr., Woodinville, WA (US);

Jebaraj Moses, Coimbatore, IN;

Sumit Kumar Sultania, Bangalore, IN;

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/21 (2019.01); G06F 16/23 (2019.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 16/217 (2019.01); G06F 11/302 (2013.01); G06F 16/2343 (2019.01); G06F 16/2358 (2019.01); G06F 16/2379 (2019.01); G06F 11/3438 (2013.01); G06F 2201/80 (2013.01); G06F 2201/88 (2013.01);
Abstract

Systems, methods, and computer-readable media are disclosed for an improved database. The systems, methods, and computer-readable media described herein may enhance the response time of databases and improve user experiences. In an example method described herein, a database monitoring system may receive instructions to perform one or more data monitoring operations comprising counting an occurrence of a first value within at least a portion of items stored in a database. The method may include determining a length of a first window of time and fetching, from a first location of a data store of the database, data indicative of a total count of the occurrence of the first value at a time associated with the beginning of the first window of time. In turn, the monitoring system may store data representing the first count in the first memory.


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